The National Institute of Standards and Technology (NIST) is seeking domestic manufacturers to produce/supply focused ion beam (FIB)/scanning election microscope (SEM) systems (opportunity 2023-023).

  • Vendor/company must be registered or willing to register in (
  • This inquiry does not guarantee award of a contract

Submit potential matches through the Supplier Scouting Submission Form by Mar. 24, 2023.

For more information about this opportunity, please contact KeAnne Hoeg at

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