The National Institute of Standards and Technology (NIST) is seeking domestic manufacturers to produce/supply focused ion beam (FIB)/scanning election microscope (SEM) systems (opportunity 2023-023).
- Vendor/company must be registered or willing to register in SAM.gov (https://sam.gov/content/home)
- This inquiry does not guarantee award of a contract
Submit potential matches through the Supplier Scouting Submission Form by Mar. 24, 2023.
For more information about this opportunity, please contact KeAnne Hoeg at firstname.lastname@example.org
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